Welcome to the The Battery Show and Electric & Hybrid Vehicle Technology Digital Days Conference Session Viewer. Browse and sort the growing list of sessions by day, time, pass type, topic, or format. All session times are shown in Eastern Time, except 3rd day (November 12th) EU Conference Pass sessions are in Central European Time. Check out the event Conference Page for more information related to the event schedule. Register for Digital Days and login to the event platform to begin bookmarking sessions, building your schedule, and accessing whitepapers.
Edward Brorein (Application Engineer, Keysight Technologies)
Location: USA
Date: Wednesday, November 11
Time: 1:15pm - 1:30pm
Pass Type: Virtual Conference Pass (Paid), Virtual Conference Pass + EU (Paid)
Track: Battery Design & Manufacturing
Format: Technology Lightning Talk
Vault Recording: TBD
Audience Level: All
Li-Ion cells all have self-discharge. Some is normal but excess self-discharge indicates potentially catastrophic problems, dictating all cells must be screened in manufacturing. However, the challenge here is self-discharge is far from being relatively fixed and constant. It varies greatly with rest time since charging or discharging, temperature changes, and state of charge. This causes results from lot-to-lot, or even within a lot, to be grossly inconsistent, hindering the ability to effectively screen out cells with excess self-discharge. In this presentation, Keysight will share data quantifying external influences on self-discharge measurements, providing key insights on achieving consistently valid results for more effective screening of cells in manufacturing.
Attendees will gain greater appreciation of how various external factors impact their cell self-discharge measurements, to what degree they're impacted, and how to account for them, through the test data and analysis shared from this presentation.
Engineers and scientists responsible for formation and electrical test processes and yields for LiIon cells in manufacturing, will benefit greatly from attending this presentation.